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Focus on Metrology 11th July 2018

Event: Focus on Metrology: The scale of possibilities for UK manufacturers Date: 11th July 2018, 9:30 – 16:30 Venue: The Manufacturing Technology Centre, Ansty Park, Coventry, CV7 9JU – please click here for directions DISCOVER THE ART OF THE POSSIBLE IN METROLOGY AND INSPECTION TECHNOLOGIES – AND HOW IT CAN BENEFIT MANUFACTURERS. You’ll get insights into… Read more »

KOTEM at 3D CIC 2017

The 3D Collaboration & Interoperability Congress

  Event: 3D Collaboration & Interoperability Congress When: October 15-18, 2018 Where: Golden, Colorado Theme: Enterprise Accountability The 3D Collaboration & Interoperability Congress has become a yearly barometer of the state of collaboration and interoperability strategy, technology, and solutions for commercial and government organizations. Presenters and attendees are real-world users who represent the medical, aerospace, defense,… Read more »

Big Data and PLM Intelligence

Big Data and GD&T Together? Maybe it should be stated that the new Big Data is product part’s measured points and the new analytics is the software that can answer the what-if questions of designs intent and manufacture capabilities that live in many silos that is hard for companies to be able to realize them…. Read more »

A New Age of Industrial Analytics

Putting Data into Context Industrial analytics is a rapidly emerging area of manufacturing innovation. It’s part of the conversation at Kotem and probably many other companies looking toward the future of manufacturing. The people at Digital Engineering recently posted an interesting article about the new age of industrial analytics and the industrial internet of things (IIOT)…. Read more »

ISO 1101:2017 Geometrical Product Specification

ISO 1101:2017 is a GPS standard from the International Organization for Standardization (ISO), a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to… Read more »

Quality Information Framework

Quality Information Framework (QIF) is an American National Standard supporting digital thread concepts in engineering applications ranging from product design through manufacturing to quality inspection. Based on the XML Standard, it contains a library of XML schema that ensure both data integrity and data interoperability in Model-Based Enterprise (MBD) implementation. QIF supports Design, Metrology, & Manufacturing…. Read more »

DMSC

The mission of Dimensional Metrology Standards Consortium (DMSC™, Inc.) is to identify urgently needed standards in the field of dimensional metrology, and to promote, foster, and encourage the development and interoperability of these standards, along with related and supporting standards that will benefit the industry as a whole.  The Dimensional Measuring Interface Standard (DMIS) and… Read more »

EVOLVE Design and EVOLVE SPC are Shipping

KOTEM expanded the EVOLVE Suite with the official release of EVOLVE Design and EVOLVE SPC software products on January 31, 2018. Both products are now part of the EVOLVE Suite in addition to being available as independent software products.

KOTEM is Attending Model-Based Enterprise Summit 2018

KOTEM is participating at this year’s Model-based Enterprise Summit 2018 hosted by NIST. The MBE Summit is the place to learn about the current state of the art in MBE– the manufacturing practice where a digital three-dimensional (3D) model of the product serves as the authoritative information source for all activities in a product’s lifecycle…. Read more »

National Institute of Standards and Technology – NIST

The National Institute of Standards and Technology (NIST) was founded in 1901 and is now part of the U.S. Department of Commerce. NIST is one of the nation’s oldest physical science laboratories. Congress established the agency to remove a major challenge to U.S. industrial competitiveness at the time—a second-rate measurement infrastructure that lagged behind the… Read more »